
Specular Reflection Accessory, 12° - ERA-12G
Harrick Scientific's Specular Reflection Accessories are valuable for studies of films on metallic substrates and measurements of epitaxial film thickness by UV-Vis or FT-IR spectroscopy. A selection...
The reflectance reference provides a method for calculating the reflectivity of a material from a measured spectrum of a sample. The experimental measurement is obtained in a particular wavenumber region for s-, p- or mixe ... read more
The reflectance reference provides a method for calculating the reflectivity of a material from a measured spectrum of a sample. The experimental measurement is obtained in a particular wavenumber region for s-, p- or mixed polarization. The mid-infrared reflectance reference is suitable for use from 5000 cm⁻¹ to 400 cm⁻¹. The reflectance reference is perfectly suited to absolute reflectance measurements of materials. It is ideal for coatings on mirrors and reflective substrates.
Download Reflectance Reference Data Sheet (pdf)
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