Harrick's Near-Normal Specular Reflection Accessory is ideal for infrared and UV-Vis reflectance measurements of films on metallic substrates, epitaxial films, anti-reflection and enhanced reflection coatings. Suitable for ... read more
Harrick's Near-Normal Specular Reflection Accessory is ideal for infrared and UV-Vis reflectance measurements of films on metallic substrates, epitaxial films, anti-reflection and enhanced reflection...
Harrick's Near-Normal Specular Reflection Accessory is ideal for infrared and UV-Vis reflectance measurements of films on metallic substrates, epitaxial films, anti-reflection and enhanced reflection coatings. Suitable for use with opaque materials.
This specular reflection accessory has a fixed 8º incident angle and a convenient horizontal sampling surface. It comes with interchangeable masks for examining small samples or small areas on large samples. This accessory is floor mounted and has a three-point sample support for excellent repeatability of the spectroscopic measurements.
Download Near-Normal Specular Reflection Accessory Data Sheet (pdf)
Harrick Scientific's Specular Reflection Accessories are valuable for studies of films on metallic substrates and measurements of epitaxial film thickness by UV-Vis or FT-IR spectroscopy. A selection...
Harrick Scientific's Specular Reflection Accessories are valuable for studies of films on metallic substrates and measurements of epitaxial film thickness by UV-Vis or FT-IR spectroscopy. A selection...
Harrick Scientific's Specular Reflection Accessories are valuable for studies of films on metallic substrates and measurements of epitaxial film thickness by UV-Vis or FT-IR spectroscopy. A selection...
Harrick Scientific's Specular Reflection Accessories are valuable for studies of films on metallic substrates and measurements of epitaxial film thickness by UV-Vis or FT-IR spectroscopy. A selection...
Harrick Scientific's Specular Reflection Accessories are valuable for studies of films on metallic substrates and measurements of epitaxial film thickness by UV-Vis or FT-IR spectroscopy. A selection...
Sample Support for the Near-Normal and Specular Refl. Accys