Variable Angle Reflection Accessory - VRT-XXX

Harrick's Variable Angle Specular Reflection Accessory is the industry standard for variable angle specular reflectance spectroscopy. It is ideal for specular reflection studies of films on metallic substrates, coatings, contaminants on reflective surfaces, and measurements of film thickness. The sample stage is readily adapted for absolute reflectance measurements or convenient horizontal reflectance measurements at a 12° incident angle. Models available for use in all FT-IR spectrometers and most UV-Vis spectrometers.

Features

• Incident angle variable from 30° to 85°.
• Accommodates samples larger than 12mm x 12mm, up to 12mm thick.
• Maintains alignment for all incident angles.
• Optional Reflectance Reference for mid-infrared absolute reflectance measurements.
• Adaptable for variable angle, fixed angle, and absolute specular reflection studies.
• Optional sample stages for absolute specular reflectance and horizontal sampling.
• Models available for a wide range of FT-IR spectrometers and UV-Vis spectrometers.

Includes

• Optical base unit with variable angle specular reflectance sample stage.
• Mating hardware for the specified UV-Vis or FT-IR spectrometer.

Technical Info

Download Variable Angle Specular Reflection Accessory data sheet (pdf)

Download Variable Angle Specular Reflection Accessory Application Notes:

• External Reflection Spectroscopy: Selection of the Optimum Parameters for Thin Films on Smooth Metals
• Comparison of Absolute Reflectance Methods: VW vs Reflectance Relative to a Standard