The VariGATR™ grazing angle ATR accessory is a revolutionary approach to the analysis of monolayers on semiconductor and metallic substrates. The VariGATR™ is variable angle, so the incident angle can be optimized for the highest sensitivity with these types of samples. Its specially designed pressure applicator is optimized for delivering good contact between the sample and the Ge ATR crystal. The VariGATR™ is excellent for rapid, repeatable measurements and provides at least an order of magnitude increase in sensitivity relative to grazing angle methods. In addition, it offers the convenience of an easy to use, fully prealigned, horizontal sampling accessory.