Fixed Angle

Infrared Accessory Kit

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Infrared Accessory Kit
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Start up accessory kit for FTIR spectrometers
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Model No.
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Start up accessory kit for FTIR spectrometers

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SplitPea™ ATR Microsamplers

Harrick's SplitPea™ is a horizontal ATR accessory with the smallest sampling area of any ATR accessory - less than 250 µm in diameter for its Si ATR crystal. The SplitPea™ is configured to apply localized, measured pressure to produce superior contact between the sample and the ATR crystal.

Specular Reflection Accessories

Harrick Scientific's Specular Reflection Accessories are valuable for studies of films on metallic substrates and measurements of epitaxial film thickness by UV-Vis or FT-IR spectroscopy. A selection of incident angles is available, as required by different applications.

Refractor2™ Grazing Angle Accessory

The Refractor2™ is a unique attachment for grazing angle specular reflectance spectroscopy. The Refractor2™ incorporates two SuperCharged™ wedged windows to refract the beam to and from the sample. It also includes a pre-mounted, internal Si polarizer for enhanced spectral contrast.

RefractorReactor™ Grazing Angle Accessory

The Refractor™ Reactor is a valuable tool for grazing angle FT-IR studies of reactions on metal surfaces and on thin films on metal substrates. Samples can be heated to 500°C and pressurized up to 203 kPa (2 ATM).

Omni-Spec™ Specular Reflection Probe

The Omni-Spec™ is a 45° specular reflectance probe for sampling outside of the sample compartment.

Near-Normal Specular Reflection Accessory

Harrick's Near-Normal Specular Reflection Accessory is ideal for infrared and UV-Vis reflectance measurements of films on metallic substrates, epitaxial films, anti-reflection and enhanced reflection coatings. Suitable for use with opaque materials.

Infrared Accessory Kit

Our Infrared Accessory Kit is a general purpose kit for sampling gases, liquids and solids by infrared (FTIR) spectroscopy. It contains accessories necessary for the transmission analysis of gases, ATR measurements of liquids and solids, and investigations of solid by specular reflectance.

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